Looking for the best Microelectronics Engineering?
Discover now our comparison of the best Microelectronics Engineering. It is never easy to choose from the wide range of offers. On the market, you will find an incalculable number of models, all at different prices. And as you will discover, the best Microelectronics Engineering are not always the ones at the highest prices! Many criteria are used, and they make the richness and relevance of this comparison.
To help you make the best choice among the hundreds of products available, we have decided to offer you a comparison of the Microelectronics Engineering in order to find the best quality/price ratio. In this ranking, you will find products listed according to their price, but also their characteristics and the opinions of other customers. Also discover our comparisons by categories. You won’t have to choose your products at random anymore.
- Hardcover Book
- Sedra, Adel S. (Author)
- English (Publication Language)
- 1296 Pages - 11/15/2019 (Publication Date) - Oxford University Press (Publisher)
- Hardcover Book
- Campbell, Stephen A. (Author)
- English (Publication Language)
- 624 Pages - 02/15/2001 (Publication Date) - Oxford University Press (Publisher)
- Amazon Kindle Edition
- Maiti, C.K. (Author)
- English (Publication Language)
- 320 Pages - 10/03/2018 (Publication Date) - CRC Press (Publisher)
- MULTIPLE TESTING TYPES Include logic device test, interface driver device test, op amp, comparison test, transistor identification, voltage regulator voltage value test, optocoupler
- MULTIPLE TEST MODES Multifunction integrated circuit tester is a professional instrument designed for microelectronics engineers and maintenance personnel. Different test modes can be selected, such as 5V mode, 3.3V mode, AUTO mode, etc.
- EFFICIENT MEASUREMENT With more than 1,300 types of built in chip data models and more than 420 types of transistor data models, covering most common devices within 24 pins, greatly reduce workload and improve work efficiency
- TESTING TYPES: Include logic device test, interface driver device test, op amp, comparison test, transistor identification, voltage regulator voltage value test, optocoupler.
- AUTOMATIC SHUTDOWN FUNCTION The integrated circuit tester will automatically shut down after 60 seconds without any operation. Small and portable design, suitable for circuit testing.
- Hardcover Book
- Sedra, Adel S. (Author)
- English (Publication Language)
- 1456 Pages - 12/15/2009 (Publication Date) - Oxford University Press (Publisher)
- Adel S. Sedra (Author)
- English (Publication Language)
- 927 Pages - 05/10/1982 (Publication Date) - Thomson Learning (Publisher)
- Hardcover Book
- Razavi, Behzad (Author)
- English (Publication Language)
- 916 Pages - 09/22/2011 (Publication Date) - Pearson (Publisher)
- Hardcover Book
- Sedra, Adel S. (Author)
- English (Publication Language)
- 1488 Pages - 11/14/2014 (Publication Date) - Oxford University Press (Publisher)
- Microelectronic Circuit Design 6th Edition
- Microelectronic Circuit Design 6th Edition
- Jaeger Professor of Electrical Engineering, Richard C. (Author)
- English (Publication Language)
- 04/20/2022 (Publication Date) - McGraw Hill (Publisher)
- Gaudet, Vincent C. (Author)
- English (Publication Language)
- 120 Pages - 11/14/2014 (Publication Date) - Oxford University Press (Publisher)
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Last update on 2024-05-10 / Affiliate links / Images from Amazon Product Advertising API